Analyze, understand, and optimize surfaces and microstructures
The CMS platform brings together experimental resources dedicated to the multiphysics characterization of materials, their microstructures, and their surface properties. It combines microstructural, micromechanical (in situ), chemical, optical, and sensory approaches to study materials from the micro/nano scale to surface performance (adhesion, wear, stresses, functionalization, etc.).
Characterization Areas
Microstructural and Chemical Characterization
- Identification of phases, morphologies, and heterogeneities
- Local chemical analysis and elemental mapping
- Studies of interfaces, thin films, and composition gradients
Micromechanical Characterization (including in situ)
- Measurement of local mechanical properties (micro/nano scale)
- Analysis of surface and near-surface response (stresses, treatment effects, aging)
Optical and Sensory Characterization
- Optical and spectral measurements to correlate surface condition with functional properties (appearance, color, spectral response, IR signatures, etc.)
Available Equipment and Techniques
The CMS platform employs in particular:
- Surface spectroscopies: XPS / AES
- Electron microscopies:
- SEM (scanning electron microscope)
- TEM (transmission electron microscope) – via CLYM / UJM access
- EBSD, EDX (crystallographic and elemental mapping)
- AFM (atomic force microscopy)
- Nano-indentation
- Gonio-spectro-photometer
- Infrared spectroscopy (IR)
Equipment Focus: FIB (Focused Ion Beam)
The platform includes a FIB system enabling fine sample preparation through cutting/milling using ion beams, particularly for:
- preparation of samples for transmission electron microscopy (TEM);
- controlled surface and subsurface sectioning;
- advanced preparation for local mechanical characterization and analysis of residual surface stresses (via tailored cutting/milling strategies).
This system is available at CLYM Saint-Étienne (Université Jean Monnet), as part of access to transmission electron microscopy and associated preparation tools.
Equipment Managers
Who is it for?
The CMS platform serves:
- research teams (projects, theses, publications);
- industrial partners (R&D, qualification, defect analysis, surface optimization, process control);
- projects requiring detailed characterization of surfaces, interfaces, and microstructures.
Access Procedures
Depending on your needs, the platform offers:
- measurement services (preparation, acquisition, initial analysis);
- support (technique selection, protocol definition, interpretation, comparative campaigns);
- guidance toward the most appropriate instrumentation chain (CMS ↔ CLYM/UJM for TEM/FIB).
Contact
To assess feasibility (sample type, required preparation, measurement objectives):