Led by INFINEON and ST Microelectronics within an industry/research consortium of 14 European partners, this project aims to develop diagnostic solutions and reduce the risk of production defects in wafer manufacturing systems.
Fully positioned in the industry of the future and digitalization, it will draw on the expertise of the Institut Fayol (LIMOS team – CNRS-INS2I) at the convergence of industrial engineering and machine learning techniques.
Failure analysis throughout the value chain starting from a chip is a prerequisite for improving the quality and therefore the competitiveness of electronic devices, particularly in the automotive and industrial markets for applications demanding high reliability and safety.
The project “Failure Analysis 4.0 – Key for reliable electronic devices in smart mobility and industrial production” will begin in April 2020 with the objective of developing an operational automated process for failure diagnosis, the highest technological challenge for electronic components.
14 industrial and academic partners are grouped within this European consortium (Germany, France, Czech Republic): INFINEON (project coordinator), ST-Microelectronics, Bosch, four SMEs and three companies (equipment manufacturers and associated software), Mines Saint-Étienne, Fraunhofer IMWS, University of Stuttgart, Jean Monnet University Saint-Étienne.
The project will draw on the expertise of the Institut Fayol within the departments of Environmental and Organizational Engineering (Xavier Boucher, industrial engineering) and Mathematics and Operations Research for Engineering (Mireille Batton-Hubert and Rodolphe Le Riche for machine learning techniques).
With a total budget of €11.2M for the consortium, including €382k for our school, it is funded by the EUREKA / PENTA –EURIPIDES Programme; and coordinated for Mines Saint-Étienne by Xavier Boucher, Research Director at the Institut Fayol, LIMOS team – CNRS-INS2I.
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