506 documents
- Margaux Nattaf, Stéphane Dauzère-Pérès, Claude Yugma. Parallel machine scheduling with time constraints on machine qualifications. 23rd International Symposium on Mathematical Programming, 2018, Bordeaux, France. ⟨hal-02136563⟩
- Alexandre Lima, Valeria Borodin, Stéphane Dauzère-Pérès, Philippe Vialletelle. Analyzing different dispatching policies for probability estimation in time constraint tunnels in semiconductor manufacturing. 2017 Winter Simulation Conference (WSC), Dec 2017, Las Vegas, United States. ⟨10.1109/WSC.2017.8248068⟩. ⟨emse-01703950⟩
- Stéphane Dauzère-Pérès. Achievements and lessons learned from a long-term academic-industrial collaboration. 2017 Winter Simulation Conference (WSC), Dec 2017, Las Vegas, United States. ⟨10.1109/WSC.2017.8248082⟩. ⟨emse-01792269⟩
- Nadjib Brahimi, Nabil Absi, Stéphane Dauzère-Pérès, Atle Nordli. Single-item dynamic lot-sizing problems: An updated survey. European Journal of Operational Research, 2017, 263 (3), pp.838-863. ⟨10.1016/j.ejor.2017.05.008⟩. ⟨emse-01792227⟩
- Alexandre Iglesias. Calcul d'itinéraire multicritère en transport multimodal. Autre. Université de Lyon, 2017. Français. ⟨NNT : 2017LYSEM025⟩. ⟨tel-01848737⟩
- Sophia Bourzgui, Agnès Roussy, Jakey Blue, Gaëlle Georges, Emilie Faivre, et al.. Device pattern impact on optical endpoint detection by interferometry for STI CMP. International Conference on Planarization/CMP Technology, Oct 2017, Leuven, Belgium. ⟨hal-01622593⟩
- Hamideh Rostami, Jakey Blue, Claude Yugma. Equipment Health Diagnosis and Prognosis using a Wavelet-based Windowing Approach in Semiconductor Manufacturing. Advanced Process Control Conference, Oct 2017, Austin,TX, United States. ⟨emse-01621977⟩
- Hamideh Rostami, Jakey Blue, Claude Yugma. Automatic equipment fault fingerprint extraction for the fault diagnostic on the batch process data. Applied Soft Computing, 2017, 68, pp.972-989. ⟨10.1016/j.asoc.2017.10.029⟩. ⟨emse-01629337⟩
- Lars Monch, Chen-Fu Chien, Stéphane Dauzère-Pérès, Hans Ehm, John W. Fowler. Modelling and analysis of semiconductor supply chains. International Journal of Production Research, 2017, 56 (13), pp.4521-4523. ⟨emse-02023998⟩
- Juan Alejandro Sendon Perez. Risk minimization through metrology in semiconductor manufacturing. Other. Université de Lyon, 2017. English. ⟨NNT : 2017LYSEM022⟩. ⟨tel-02878704⟩
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