510 documents
- Alejandro Sendon, Stéphane Dauzère-Pérès, Jacques Pinaton. Simulation model to control risk levels on process equipment through metrology in semiconductor manufacturing. 2015 Winter Simulation Conference (WSC), Dec 2015, Huntington Beach, United States. ⟨10.1109/WSC.2015.7408397⟩. ⟨emse-01792282⟩
- Ahmed Ben Amira. Modélisation agile pour un système de fabrication complexe et dynamique. Autre. Ecole Nationale Supérieure des Mines de Saint-Etienne, 2015. Français. ⟨NNT : 2015EMSE0793⟩. ⟨tel-01369238⟩
- Nadjib Brahimi, Nabil Absi, Stéphane Dauzère-Pérès, Safia Kedad-Sidhoum. Models and Lagrangian heuristics for a two-level lot-sizing problem with bounded inventory. OR Spectrum, 2015, 37 (4), pp.983-1006. ⟨10.1007/s00291-015-0404-0⟩. ⟨emse-01181851⟩
- Espéran Padonou, Jakey Blue. Wafer Spatial Pattern Decomposition and Diagnosis Based on Processing Characteristics. 15th Annual Conference of the European Network for Business and Industrial Statistics ENBIS-15, Sep 2015, Prague, Czech Republic. ⟨emse-01412221⟩
- Garima Singh, Julien Lozi, Olivier Guyon, Pierre Baudoz, Nemanja Jovanovic, et al.. On-Sky Demonstration of Low-Order Wavefront Sensing and Control with Focal Plane Phase Mask Coronagraphs. Publications of the Astronomical Society of the Pacific, 2015, 127 (955), pp.857-869. ⟨10.1086/682726⟩. ⟨hal-02874691⟩
- Lars Moench, Claude Yugma. Scheduling Jobs on Parallel Machines with Qualification Constraints. International Conference on Automation Science and Engineering (CASE), Aug 2015, Gothebourg, Sweden. ⟨hal-02067673⟩
- Mehdi Rowshannahad. Qualification Management and Closed-Loop Production Planning in Semiconductor Manufacturing. Other. Ecole Nationale Supérieure des Mines de Saint-Etienne, 2015. English. ⟨NNT : 2015EMSE0784⟩. ⟨tel-01231124⟩
- Rezvan Sadeghi, Stéphane Dauzère-Pérès, Claude Yugma, Guillaume Lepelletier. Production control in semiconductor manufacturing with time constraints. 2015 26th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC), May 2015, Saratoga Springs, United States. ⟨10.1109/ASMC.2015.7164446⟩. ⟨emse-01792284⟩
- Espéran Padonou, Olivier Roustant, Jakey Blue, Duverneuil Hugues. Spatial risk assessment on circular domains: Application to wafer profile monitoring. 26th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC), May 2015, Saratoga Springs, United States. ⟨10.1109/ASMC.2015.7164475⟩. ⟨emse-01338842⟩
- Stéphane Dauzère-Pérès, David de Almeida, Olivier Guyon, Faten Benhizia. A Lagrangian heuristic framework for a real-life integrated planning problem of railway transportation resources. Transportation Research Part B: Methodological, 2015, 74, pp.138-150. ⟨10.1016/j.trb.2015.01.008⟩. ⟨emse-01138202⟩
Powered by HAL 