510 documents
- Jakey Blue, Dietmar Gleispach, Agnès Roussy, Scheibelhofer Peter. Tool Condition Diagnosis With a Recipe-Independent Hierarchical Monitoring Scheme. IEEE Transactions on Semiconductor Manufacturing, 2013, 26 (1), pp.82-91. ⟨10.1109/TSM.2012.2230279⟩. ⟨hal-01079929⟩
- Charlotte Jimenez, Stéphane Dauzère-Pérès, Christian Feuillebois, Eric Pauly. Optimizing the positioning and technological choices of RFID elements for aircraft part identification. European Journal of Operational Research, 2013, 227, pp.350-357. ⟨10.1016/j.ejor.2012.10.034⟩. ⟨emse-00755332⟩
- Nabil Absi, Boris Detienne, Stéphane Dauzère-Pérès. Heuristics for the multi-item capacitated lot-sizing problem with lost sales. Computers and Operations Research, 2013, 40 (1), pp.264-272. ⟨10.1016/j.cor.2012.06.010⟩. ⟨emse-00733895⟩
- Justin Ndhuhura-Munga, Gloria Rodriguez-Verjan, Stéphane Dauzere-Peres, Claude Yugma, Philippe Vialletelle, et al.. A literature review on sampling techniques in semiconductor manufacturing. IEEE Transactions on Semiconductor Manufacturing, 2013, 26 (2), pp.188-195. ⟨emse-01095720⟩
- Stéphane Dauzère-Pérès, Lars Moench. Scheduling jobs on a single batch processing machine with incompatible job families and weighted number of tardy jobs objective. Computers and Operations Research, 2013, 40 (5), pp.1224-1233. ⟨10.1016/j.cor.2012.12.012⟩. ⟨emse-00773587⟩
- Martin Géhan, Nabil Absi, Bruno Castanier, Stéphane Dauzère-Pérès, David Lemoine. Tactical production planning under system availability constraint. International Workshop on Lot Sizing (IWLS 2013), 2013, Brussels, Belgium. ⟨hal-00860480⟩
- Lobna Haouari. MODELISATION ET SIMULATION DE L’INTRODUCTION DE TECHNOLOGIES RFID DANS DES SYSTEMES DE CONFIGURATION A LA DEMANDE. Autre. Ecole Nationale Supérieure des Mines de Saint-Etienne, 2012. Français. ⟨NNT : 2012EMSE0680⟩. ⟨tel-00861859⟩
- Justin Nduhura Munga, Stéphane Dauzère-Pérès, Philippe Vialletelle, Claude Yugma. Industrial implementation of a dynamic sampling algorithm in semiconductor manufacturing: Approach and challenges. 2012 Winter Simulation Conference - (WSC 2012), Dec 2012, Berlin, France. ⟨10.1109/WSC.2012.6465296⟩. ⟨emse-01792315⟩
- Justin Nduhura Munga, Stéphane Dauzère-Pérès, Philippe Vialletelle, Claude Yugma. INDUSTRIAL IMPLEMENTATION OF A DYNAMIC SAMPLING ALGORITHM IN SEMICONDUCTOR MANUFACTURING: APPROACH AND CHALLENGES. Modeling and Analysis of Semiconductor Manufacturing (MASM) Conference (included in Winter Simulation Conference), Dec 2012, Berlin, Germany. 9 p. ⟨hal-00719785⟩
- Gloria Luz Rodriguez Verjan, Stéphane Dauzère-Pérès, Jacques Pinaton. A Mathematical Model for Estimating Defectivity Capacity with a Dynamic Control Strategy. Winter Simulation Conference, Dec 2012, Berlin, Germany. pp.1-9. ⟨emse-00755796⟩
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