SPIN Centre for Chemical Engineering
FR
Rechercher
Fermer
Menu

SPIN Centre for Chemical Engineering

Home | Ressources | Characterization facilities

Characterization facilities

Geometrical analysis (surface and volume)

  • Imaging
    • Optical microscopy
    • Image analysis and processing
    • Fast camera
    • AFM – Atomic Force Microscopy (shared)
    • Profilometry
    • SEM – Scanning Electron Microscopy (shared)
    • TEM – Transmission Electron Microscopy (conventional or in-situ) (shared)
    • 3D X-ray tomography
    • Synchrotron @ ESRF-Grenoble (access to)
  • Sizing
    • BET surface specific area
    • Helium pycnometry
    • Laser granulometry
    • Mercury intrusion porosimetry

Thermal analysis

  • Thermogravimetric
    • ATG
    • ATG-DSC
  • Dilatometry
  • Calorimetry

Chemical analysis

  • Spectroscopic analysis
    • Raman
    • Infra-Red
    • XPS et ESCA – X-Ray Photoelectron spectrometry (shared)
    • Auger spectrometry (shared)
  • Elemental analysis
    • ICP-AES
    • ICP-MS
    • AAS (Atomic Absorption Spectroscopy)
  • Chromatographic analysis
    • Ionic chromatography
    • Gas chromatography
    • HPLC (High Pressure Liquid Chromatography)
  • X-rays diffractometry (shared)

Electrical analysis

  • EFM – Electrostatic Force Microscopy (shared)
  • Faraday cup + electrometer
  • Impedance spectroscopy

Acoustical / vibrations analysis

  • Acoustic emission
  • Ultrasonic transducers (single, array) + signal generator
  • Pulse emitter/receiver
  • Time of flight
  • Electromagnetic shakers

Mechanical analysis

  • Tension/compression machine
  • Nano-indentation (coupled to SEM) (shared)
  • Dilatometry
  • Rheometry (powder, liquids, pastes)
  • Surface tension by pendant drop method

Field analysis

  • GPS
  • Conductimetry