My research activity is focused on the development of flexible printed devices: sensors and TFTs.

My expertise domains are physics of semiconductor, reliability and printed electronics.

My research topics cover material characterization, printed electronics and reliability.

Semiconductor physics, printed electronics, material characterization and reliability – Master degree

From 1990 to 2001, I worked within the IBM Microelectronics Division, responsible of the yield learning of a bipolar memory product, then developed processes in the area of dielectric deposition and finally took the management of the Characterization Laboratory. From 2001 to 2003, I was with Alcatel Optronics, responsible for the reliability improvement of III-V lasers and detectors.
In September 2003, I joined the “Ecole Nationale Supérieure des Mines de Saint-Etienne” as a professor in the Flexible Electronics Laboratory (FEL). My research activity focused on the development of flexible printed devices: sensors and TFTs with a special focus on the characterization of interfaces. My expertise domains are physics of semiconductor, reliability and printed electronics.
I’ve been part of different projects dealing with the reliability of RFID tags for medical and aeronautic applications; industrial partners being IBM and Eurocopter. I’ve also developed a printed acoustic sensor within the “Spinnaker” project. I am currently co-supervising a PhD student with a French start-up “IRlynx” and the LGEF laboratory (INSA Lyon) related to the development of printed ferroelectric capacitors on IC wafer

I received the M.S. degree in Solid State Physics and the Ph.D.degree in Materials Science from the University of Lille (France) in 1985 and 1989, respectively.
I did a “one-year post-doct” at the Fraunhöfer Institüt fur Angewandte Festkörperphysik in Freiburg (Germany)

1990-2001 : IBM Microelectronic Division
2001-2003 : Alcatel Optronics
2003 : Mines Saint Etienne

Inkjet printing of high molecular weight PVDF-TrFE for flexible electronics
R. Haque, R. Vié, M. Germainy, L. Valbin, P. Benaben, X. Boddaert
Flexible Printed Electronics 1 (2016) 015001

Ellipsometry study of process deposition of amorphous IGZO sputtered thin films
C. Talagrand, X. Boddaert, D.G. Selmeczi, C. Defranoux, P. Collot
Thin Solid Films 590(2015) 134-140

Optimization of capacitive acoustic resonant sensor using numerical simulation and design of experiment
Rubaiyet HAQUE, Christophe LOUSSERT, Michelle SERGENT, Patrick BENABEN, Xavier BODDAERT *
Sensors 2015,15,8945-8967 ;doi.10.3390/s150408945

RFID Tags for Cryogenic Applications : Experimental and Numerical Analysis of Thermo-Mechanical Behaviour
R. Cauchois, M. Su Yin, A. Gouantes, X. Boddaert
Microelectronics Reliability 53 (2013), 885-891

Ge2Sb2Te5 layer used as solid electrolyte in conductive-bridge memory devices fabricated on flexible substrate
D. Deleruyelle , Magalie Putero , T. Ouled-Khachroum , Marc Bocquet , M.V. Coulet , Xavier Boddaert , C. Calmes , Christophe Muller
Solid State Electronics, Volume 79, issue (January, 2013), p. 159-165

Characterization of Organic Ultra-Thin Film Adhesion on Flexible Substrate Using Scratch Test Technique
G. Covarel, B. Bensaid, X. Boddaert, S. Giljean, P. Benaben, P. Louis
Surface & Coatings Technology 211 (2012) 138-142